About Us

Henan LIMING Heavy Industry Science and Technology Co. LTD which mainly manufacture large and medium-sized crushing and grinding equipments was founded in 1987. It is a modern joint-stock corporation with research, manufacturing and sales together. The Headquarter is located in HI-TECH Industry Development Zone of Zhengzhou and covers 80000 m ². Another workshop in Shangjie Industry Park covers 67000 m ². Over the more than 30 years, our company adheres to modern scientific management system, precision manufacturing, pioneering and innovation. Now LIMING has become the leader in domestic and oversea machinery manufacturing industry.

120

million

cubic meters

Industrial chain production base

70

national patents

689sets

national patents

170

Equipment service country

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core values of the company

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Standardization, value, serialization, and differentiation will always exceed our contract

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Case Scene

Application Note Argon ion milling of FIB lift-out samples

Argon ion milling of FIB lift-out samples Technoorg Linda Ltd. Ipari Park u. 10, H-1044 Budapest, Hungary, Tel: (36-1) 479 0608, (36-1) 479 0609, Fax: (36-1) 322 4089, E-mail: [email protected] Web: technoorg.hu Application Note Introduction The high-resolution TEM and combined analytical methods became more and more important in the recent investigations of material science. As a result ...

Combining Ar ion milling with FIB lift-out techniques to ...

We have developed techniques to combine broad argon ion milling with focused ion beam lift-out methods to prepare high-quality site-specific TEM cross-section samples. Site-specific TEM cross-sections were prepared by FIB and lifted out using a Narishige micromanipulator onto a half copper-grid coated with carbon film. Pt deposition by FIB was used to bond the lamellae to the Cu grid, then the ...

Argon Ion Polishing of Focused Ion Beam Specimens in PIPS ...

Argon ion milling: Most promising method for multi-layer materials, as none of the drawbacks mentioned above is present. Here the original FIB damage layer is replaced by newly formed Ar ion- induced damage layer.3,6 The thickness of this layer depends on the milling energy, angle and time, which are all parameters controlled by the user in the Gatan PIPS™ II System.

Ion beam induced artifacts; focus on FIB

Ion milling with Argon gas is usually the final step in TEM specimen preparation by mechanical polishing, such as Dimple Grinding/Polishing and wedge (TriPod) Polishing. For a description, see Application 1.

APPLICATION NOTE Spin Mill method for large-area planar ...

APPLICATION NOTE Combined focused ion beam scanning electron microscopy (FIB-SEM) is a key technology in the life sciences and has become a common method for 3D analysis of biological samples at high resolution. Plasma FIB (PFIB) SEM tomography is based on the cross-section technique, where the sample is perpendicular to the ion beam and remains tilted during the imaging process. In this ...

Combining Ar ion milling with FIB lift‐out techniques to ...

13/08/2004  We have developed techniques to combine broad argon ion milling with focused ion beam lift‐out methods to prepare high‐quality site‐specific TEM cross‐section samples. Site‐specific TEM cross‐sections were prepared by FIB and lifted out using a Narishige micromanipulator onto a half copper‐grid coated with carbon film. Pt deposition by FIB was used to bond the lamellae to the Cu ...

Application of Low Energy Broad Ion Beam Milling to ...

milling mode was selected and the gun was set at 300 eV and at 3° from the top side, to mill for 30 s. The image on the right shows the sample after it was milled in the PIPS. The Nb layer is thinner and flat. Application of Low Energy Broad Ion Beam Milling to Improve the Quality of FIB

Focused Ion Beam (FIB) Applications - Fibics Incorporated

Milling Microfluidic Channels into Silicon using a Focused Ion Beam (FIB) Fluids constrained into micrometer scale structures behave differently than fluids flowing into a macro-scale environment, like water into a copper pipe. Microfluidics, with applications in...

Focused Ion Beam (FIB) Milling of Semiconductors

preparation tool for site-specific applications. The FIB can both create and modify microstructures. This is accomplished by using the FIB's precision capabilities to (1) remove material, (2) deposit material, and (3) provide localized ion implantation (see below). The FIB also can image the sample via secondary electrons or ions before, after, and during micro milling. The ability to image ...

集束イオンビーム(FIB)加工装置におけるマイクロサンプリング

1) Technoorg Linda Ltd: Argon ion milling of FIB lift-out samples, Application Note. (a)断面像 (b)平面像 図6 Pt/GC断面SIM像 (試料提供: 西方・多田研) 図3 試料設置方法によるリデポの影響 (a)断面像 (b)平面像 図7 CF断面SIM像 (試料提供: 大竹・赤坂研)

Combining Ar ion milling with FIB lift-out techniques to ...

We have developed techniques to combine broad argon ion milling with focused ion beam lift-out methods to prepare high-quality site-specific TEM cross-section samples. Site-specific TEM cross-sections were prepared by FIB and lifted out using a Narishige micromanipulator onto a half copper-grid coated with carbon film. Pt deposition by FIB was used to bond the lamellae to the Cu grid, then the ...

APPLICATION NOTE Spin Mill method for large-area planar ...

APPLICATION NOTE Combined focused ion beam scanning electron microscopy (FIB-SEM) is a key technology in the life sciences and has become a common method for 3D analysis of biological samples at high resolution. Plasma FIB (PFIB) SEM tomography is based on the cross-section technique, where the sample is perpendicular to the ion beam and remains tilted during the imaging process. In this ...

Narrow-Beam Argon Ion Milling of Carbon-Supported Ex

Narrow-Beam Argon Ion Milling of Carbon-Supported Ex Situ Lift-Out FIB Specimens - Volume 23 Issue S1. Skip to main content Accessibility help We use cookies to distinguish you from other users and to provide you with a better experience on our websites.

Applications of the FIB lift-out technique for TEM ...

The FIB (focused ion beam) lift-out technique is a fast method for the preparation of site-specific TEM specimens. The versatility of this technique is demonstrated by presenting cross-sectioned TEM specimens from several types of materials systems, including a multi-layered integrated circuit on a Si substrate, a galvanized steel, a polycrystalline SiC ceramic fiber, and a ZnSe optical ...

Argon Ion Polishing of Focused Ion Beam Specimens in

13/01/2016  Milling angle: Although it is known that a higher beam angle increases the ion induced surface damage, at low beam energies, commonly used for this specific application (0.5 keV), stopping and range of ions in matter (SRIM) models show that the sputtering yields are very similar at high and low angles. For post-FIB polishing in PIPS II system, higher angles are best applied, while considering ...

APPLICATION NOTE Cryo-FIB thinning of protein ...

APPLICATION NOTE Figure 1. The process of thinning microcrystals with a cryo-focused ion beam for micro electron diffraction analysis. A Vitrified microcrystal B CThinning for electron-transparency Electron diffraction pattern recording D Molecular structure determination Cryo-FIB lamella Transmission Electron Beam Ion Beam Several micrometers thickness is, therefore, well suited for the ...

Steps in TEM Specimen Preparation by "Lift ... - FIB Services

FIB Application Steps in TEM Specimen Preparation by "Lift-out" Method . Keywords : Sample preparation, Final polish, Lift out, TEM sample preparation . Figure 1: 1: The area of interest prior any FIB milling. Figure 2: 2: Tungsten layer deposited on the area of interest. Figure 3: 3A: Isoview of the rough cut on both sides of the area of interest. Figure 4: 3B: Top-down view of the rough cut ...

Application of FIB-SEM Techniques for the Advanced ...

The interaction between Ga + ions and the target material can offer imaging, milling, and deposition. These are the generic processes performed in the operation of the dual FIB-SEM system. Specific adaptations to the FIB sample preparation method however need to be tailored for the preparation of samples specific to particular analytical techniques (Section 3).

PIPS II System Precision Ion Polishing System Gatan, Inc.

Argon ion polishing of focused ion beam specimens in PIPS II system. Ready, set, go! Ensuring an identical TEM specimen preparation route again and again. Poster. Application of low energy broad ion beam milling to improve the quality of FIB prepared TEM samples Post FIB clean up of TEM lamella using broad argon beam polishing Atomic resolved EELS analysis across interfaces in II-V MOSFET

Journal articles Fischione

Narrow-beam argon ion milling of ex situ lift-out FIB specimens mounted on various carbon-supported grids. In ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis (pp. 339-344). Materials Park, OH: ASM International. Narrow argon ion beam, gallium-induced artifacts, amorphization

Van Loenen Instruments

Application notes Specimen preparation technique using Hitachi’s FIB/STEM Argon ion milling of FIB lift-out samples ... The low-energy ion milling and cleaning capability of semi and fully automated Gentle Mill models is used in the final stage of FIB specimen preparation to remove the amorphized or otherwise damaged surface layers. These models allow direct insertion of Hitachi’s 3D FIB ...

Applications of the FIB lift-out technique for TEM ...

The FIB (focused ion beam) lift-out technique is a fast method for the preparation of site-specific TEM specimens. The versatility of this technique is demonstrated by presenting cross-sectioned TEM specimens from several types of materials systems, including a multi-layered integrated circuit on a Si substrate, a galvanized steel, a polycrystalline SiC ceramic fiber, and a ZnSe optical ...

(PDF) Preparation of TEM samples by focused ion beam

Here we demonstrate how the two main FIB techniques ('trenching' and 'lift-out') have been used to prepare TEM samples of two clay-and phyllosilicate-bearing meteorites (ALH 78045 and ALH 88045) and we compare these techniques with conventional argon ion milling. We conclude that the FIB instrument will be of particular use in the preparation of very small and scienti cally valuable samples ...

NOVEL APPLICATION OF FOCUSED ION BEAM ELECTRON

Research Note DOI: 10.2110/palo.2009.p09-003r NOVEL APPLICATION OF FOCUSED ION BEAM ELECTRON MICROSCOPY (FIB-EM) IN PREPARATION AND ANALYSIS OF MICROFOSSIL ULTRASTRUCTURES: A NEW VIEW OF COMPLEXITY IN EARLY EUKARYOTIC ORGANISMS JAMES D. SCHIFFBAUER* and SHUHAI XIAO Department of Geosciences, Virginia Polytechnic

An improved FIB sample preparation technique for site ...

01/01/2018  Note that there exists material loss at the sides of the lamella during the ion milling, which results in a final lamella with a size of ∼ 26 × 12 µm. 4. Conclusion. A new cutting geometry is introduced for the FIB lift-out sample preparation technique with plan-view geometry. Pt layers are used to mark the ROI, and subsequently channels ...

The application of tripod polishing and focused ion beam ...

3.1 The application of tripod polishing and low angle argon ion milling A Stellite 6 coating built up layer by layer onto a mild steel substrate with the formation of splats, intersplat oxides and some porosity is shown in the BSE image of Fig. 1a. The regions of lighter contrast that exhibit fine-scale dendritic features are attributed to powder particles that had not completely melted prior ...

APPLICATION NOTE Cryo-FIB thinning of protein ...

APPLICATION NOTE Figure 1. The process of thinning microcrystals with a cryo-focused ion beam for micro electron diffraction analysis. A Vitrified microcrystal B CThinning for electron-transparency Electron diffraction pattern recording D Molecular structure determination Cryo-FIB lamella Transmission Electron Beam Ion Beam Several micrometers thickness is, therefore, well suited for the ...

Application of FIB-SEM Techniques for the Advanced ...

The interaction between Ga + ions and the target material can offer imaging, milling, and deposition. These are the generic processes performed in the operation of the dual FIB-SEM system. Specific adaptations to the FIB sample preparation method however need to be tailored for the preparation of samples specific to particular analytical techniques (Section 3).

NOVEL APPLICATION OF FOCUSED ION BEAM ELECTRON ...

Research Note DOI: 10.2110/palo.2009.p09-003r * SEPIV1 NOVEL APPLICATION OF FOCUSED ION BEAM ELECTRON MICROSCOPY (FIB-EM) IN PREPARATION AND ANALYSIS OF MICROFOSSIL ULTRASTRUCTURES: A NEW VIEW OF COMPLEXITY IN EARLY EUKARYOTIC ORGANISMS JAMES D. SCHIFFBAUER* and SHUHAI XIAO Department of Geosciences, Virginia Polytechnic

Journal articles Fischione

Narrow-beam argon ion milling of ex situ lift-out FIB specimens mounted on various carbon-supported grids. In ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis (pp. 339-344). Materials Park, OH: ASM International. Narrow argon ion beam, gallium-induced artifacts, amorphization